MICRO Buyers Guide Index

KLA-Tencor

160 Rio Robles
San Jose, CA 95134
Tel: 408/875-4200
Fax: 408/875-4144

Description:
Offers yield management and process-control solutions for semiconductor manufacturing and related industries. Offers an array of products and services for in-line wafer defect monitoring, reticle and photomask defect inspection, electron beam metrology, wafer overlay, film and surface measurement, as well as overall yield and fab-wide data analysis and consulting.

Categories this company is listed under in the MICRO Buyers Guide:

• Analytical/Metrology Equipment/Services: 300-mm Tools (95 companies)
• Analytical/Metrology Equipment/Services: Advanced Process Control (34 companies)
• Analytical/Metrology Equipment/Services: Data Management Systems/Software (44 companies)
• Analytical/Metrology Equipment/Services: Defect Detection/Inspection/Review (89 companies)
• Analytical/Metrology Equipment/Services: Microscopes, SEM/TEM (33 companies)
• Analytical/Metrology Equipment/Services: Reticle Inspection Systems (23 companies)
• Analytical/Metrology Equipment/Services: Spectrometry/Spectroscopy (ICP-MS, APIMS, SIMS, etc.) (61 companies)
• Analytical/Metrology Equipment/Services: Surface Analysis/Inspection (106 companies)
• Analytical/Metrology Equipment/Services: Surface Metrology (ellipsometers, CD, overlay, etc.) (71 companies)
• Analytical/Metrology Equipment/Services: Yield Management Software (36 companies)