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nLine

4150 Freidrich Ln., Ste. A
Austin, TX 78744
Tel: 512/440-7720
Fax: 512/447-2765

E-mail: info@nline.com

Description:
nLine manufactures tools for detecting defects on patterned wafers quickly. The Fathom tool uses novel direct-to-digital holography (DDH) phase-based defect detection, which enables high-throughput detection of defects at the bottoms of high aspect ratio structures such as contacts and vias. DDH technology is exclusive to nLine.

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