RequestLink
MICRO
Advertiser and
Product
Information

Buyer's Guide
Buyers Guide

tom
Chip Shots blog

Greatest Hits of 2005
Greatest Hits of 2005

Featured Series
Featured Series


Web Sightings

Media Kit

Comments? Suggestions? Send us your feedback.

 

MicroMagazine.com

INDUSTRY NEWS

ON DISPLAY

USDC to test cleaning process

The United States Display Consortium (USDC) will evaluate an innovative dry cleaning process on glass substrates used in FPD manufacturing. The San Jose—based consortium has signed a joint agreement with Radiance Labs to demonstrate the contamination removal capabilities of the Radiance process. The novel technique uses a laser and nitrogen gas to remove surface contaminants. The contract calls for the Vermont-based laboratory to remove contaminants on bare glass and glass containing metal and oxide layers, resist, and polyimide. The lab will develop process recipes for use with 150 products samples in final cleaning.


Moto first to use tool

Motorola has become the first U.S. company to use FAS-tok extrude and spin coating technology from FAS Technologies, the Dallas-based supplier announced. Motorola will use the system to manufacture field emission displays at its plant in Tempe, AZ. The coater and developer were delivered in April and June 1998, respectively. FAS Technologies developed the FAS-tok system for cleaning, coating, and developing photoresist layers for FEDs. According to the supplier, the technology reduces chemical waste by 75% over conventional systems. Coating uniformity is ±2%, the company adds. FEDs made at the Motorola site will be the manufacturer's first mass-produced displays, FAS says.


Thin-film tool gets nod

MicroDisplay of San Pablo, CA, selected the Filmetrics F20 thin-film measurement system to measure polyimide and cell gap thicknesses on its miniature displays. The reflective displays integrate a high-resolution AMLCD with an on-chip driver and decoding circuitry. MicroDisplay will use the tool to assess the repeatability of the liquid crystal manufacturing process and to detect display faults. The manufacturer says the new test tool will play a key role in ramping up to volume manufacturing.


MicroHome | Search | Current Issue | MicroArchives
Buyers Guide | Media Kit

Questions/comments about MICRO Magazine? E-mail us at cheynman@gmail.com.

© 2007 Tom Cheyney
All rights reserved.