 |
| Figure
5: EBI results (a) correlated with final wafer test results (b). The new
process produced fewer defects and higher yields than the old process. |

MicroHome |
Search | Current Issue | MicroArchives
Buyers Guide | Media Kit
Questions/comments about MICRO Magazine? E-mail us at cheynman@gmail.com.
© 2007 Tom Cheyney
All rights reserved.
|