Wider
'Net-based tool diagnosis is becoming a remote possibility
Led by International Sematech, the semiconductor industry
is moving rapidly to establish guidelines for the remote monitoring
and repair of fab equipment using the Internet. The goals of the so-called
e-Diagnostics program are to increase the availability of production
tools, reduce the mean-time-to-repair rate, and significantly lower
the costs of servicing equipment in the field.
Launched in spring 2000, the effort sets out to
redress one of the ironies of the Internet age: the industry that makes
the devices essential to operating the global computer network has yet
to take full advantage of the 'Net's capabilities. Sematech cites at
least four reasons for this reluctance. Those concerns center on security
of data, lack of standards, and inadequate supplier support. Loss of
intellectual property is another issue. Participants in the effort to
establish an e-Diagnostics infrastructure hope to have solutions in
place soon.
Currently, Sematech proposes an infrastructure
that will operate on up to five levels of capability:
- Level 0 has two fundamental capabilities--remote connectivity
to the tool within the fab environment and the use of practical
tools that permit the expert to work in real time on the fab tool
from a remote location.
- Level 1 involves collection and control, including the ability
to remotely log on to a tool and modify software, if permitted,
as well as data storage. This level proposes that a technician be
able to remotely view and operate user interface functions as if
standing at the tool. For each remote connection, responsible personnel
at the tool will authorize access.
- Level 2 concerns automated reporting and advanced analysis with
statistical process control capability.
- Level 3 calls for predictive maintenance, self-diagnostics, and
automated notification. At this level, tools understand what "health
checks" are needed, when they are needed, and when it is safe to
conduct them.
- Level 4 has yet to be determined.
Figures presented by Michael Splinter, senior vice
president and general manager of Intel's technology and manufacturing
group, indicate what's at stake for chipmakers. Each hour of downtime
can cost a fab as much as $100,000 in lost revenue, the executive said
at SEMI's Industry Strategy Symposium in January 2000. A fab that reduces
downtime by 1% on 50 of its most critical pieces of equipment has the
potential to save close to $100 million annually. AvantCom Network,
a supplier of Internet-based diagnostics software, cites industry statistics
showing fab equipment experiences at least 8% unscheduled downtime and
another 7% scheduled downtime.
In a technical presentation at Semicon Taiwan 2000,
Chris Saso, AvantCom's technical sales manager, asserted that a typical
critical tool failure, involving notification and gowning up, takes
11 hours from the initial alarm to repair. The total cost to bring the
tool back on-line is $1.1 million. Automatic network reporting, in contrast,
takes 89 hours from alarm to repair at a cost of approximately
$800,000 to $900,000, a savings of $300,000 or so for each critical
failure.
"We're moving at Internet speed on this," cracks
Harvey Wohlwend, program manager for e-Diagnostics at International
Sematech. "We think we're going pretty quickly. It's a unique project
in that there's very wide industry collaboration on this and very active
support in the supplier community."
Wohlwend leads the core team overseeing the implementation
effort. The team holds teleconferences every Thursday. Seven working
groups composed of Sematech members, other chipmakers, and suppliers
have divided the areas of coverage. The e-Diagnostics teams cover network
bandwidth requirements, capability taxonomy, data taxonomy, single-wire
resolution, protocol definition, the data security model, and IT security.
The working groups include representatives from suppliers such as KLA-Tencor,
AvantCom Networks, Applied Materials, Nikon, TEL, Axcelis Technologies,
and Schlumberger.
The industry has asked Wohlwend and his teams to
move quickly, he acknowledges. Participants met most recently during
Semicon Japan 2000 in early December and established a new working group
that will define "an implementation roadmap for the industry," he says.
The first meeting of the group had been set for mid-December.
The meeting in Japan was the first confab not hosted
solely by International Sematech, Wohlwend notes. A combination of people,
including Selete and SEMI, held the meeting, which revealed that the
Japanese differ in their outlook on e-Diagnostics, he says. "Their approach
was a little different. We started out with an e-Diagnostics approach,
which is a subset of e-Manufacturing. Over time we envisioned ourselves
growing into e-Manufacturing. Theirs is a kind of top-down approach.
It's top-down versus bottom-up. We're committed to meeting in the middle,
I guess."
Asked whether there's a direct yield- related or
defect-related component to the effort thus far, Wohlwend called any
such benefit "a stretch at this point. What we've done is limit the
scope to not include those topics. We do not include APC [advanced process
control] at this time. As one looks at the crystal ball, we'll probably
grow it to e-Manufacturing and somewhere along the line pick up advanced
process control."
Security--the most important matter of concern to
chipmakers--is being addressed through several initiatives, Wohlwend
points out. In particular, Sematech member companies have formed an
IT security office. They've "actually completed a set of security guidelines
that need to be followed...a lot of things like firewalls and encryption,
as well as the practices that go with them."
Several companies are forging ahead in their efforts
to find acceptable e-Diagnostics solutions in what Saso calls "this
diagnostic wave that's sweeping over the industry." In December ASM
Lithography and AvantCom launched a pilot project that will link ASML's
demonstration lab in Tempe, AZ, with the company's headquarters in Veldhoven,
Netherlands. AvantCom is providing the infrastructure that will enable
the lithography system manufacturer to connect multiple equipment.
AvantCom already has a project in place with IBM's
fab in Burlington, VT. Begun just after Semicon West 2000, that project
involves etch tools from four different suppliers, says Saso. The chipmaker
"is looking for solutions for its next-generation fabs. It has to make
a decision as to how e-Diagnostics is going to work in their infrastructure."
AvantCom's mission is to provide a secure pipeline
for its semiconductor industry clients, says Saso. The sales manager
agrees that security shares the spotlight with protection of intellectual
property as two major stumbling blocks. He identifies three different
types of data. "There is data on the tool, obviously the fab recipes
and things to make the wafer the way they want to make it," adding that
the chipmaker could choose whether to give the tool supplier some form
of license to use such data. "On the opposite end" there are algorithms,
for example, covering deposition layers. Finally, there's a "gray area
that's data created by the equipment but not necessarily recipes; how
many times a robot moves, for example.
"The tack we are taking is that these data belong
to the factory because they're within the factory walls," Saso explains.
"We basically say, 'Hey, the factory and you are going to have to decide
how you're going to use the information.' We've found that fabs are
willing to share the data if the supplier will sign up to do something
with it." The tool supplier using AvantCom's pipeline might sell the
chipmaker on the benefits of sharing the data by promising "a high-percentage
improvement in productivity," Saso suggests.
When AvantCom first became involved in the e-Diagnostics
program with Sematech, "member companies wanted to reduce the cost of
ownership of a tool by two-thirds," Saso recalls. "That was a very aggressive
reduction in our opinion." He believes chipmakers now are comfortable
with a more realistic cost-of-ownership reduction in the range of 25
to 33%.
The 1999 International Technology Roadmap for
Semiconductors points out that "80% of the time is spent simply
diagnosing the problem once a tool goes down," says Saso. Two issues
stand out. One, the tools are complex, and two, "the knowledgeable expert
is not at the tool. We're saying, let's address these two issues--how
to get more information about the tools, and see if we can get somebody
to remotely access the tool and help the field service guy."
 |
| FUTURE SHOCK: By cutting repair times, e-Diagnostics could
help chipmakers meet ITRS equipment productivity targets and the
implementation of the Roadmap's 300-mm software interface standards,
says International Sematech. |
Connectivity is the main reason ASML is working on the
project with AvantCom, says Gerard de Zwart, vice president of global
customer support engineering for the lithography system manufacturer.
"Connectivity as an enabler of future improvements of the ASML service
model, such as remote diagnostics, is considered of strategic importance.
AvantCom has so far shown it understands the needs of both suppliers
and IC manufacturers well and has the potential for becoming one of
the major suppliers of connectivity or e-services."
Whether the pilot project is successful or not
depends on several criteria, "ranging from product performance to service
levels," says de Zwart. As for important fab data, "ASML considers any
customer data we are allowed to use as very confidential, with access
within ASML on a strict need-to-know basis. During the pilot, encryption
and security during transport and storage are very important. Authentication
and access control to the AvantCom products will also be tested."
The ASML executive points out that the lithography
tool "is probably the most complex piece of equipment in the IC production
process. It's influenced by many parameters, ranging from ambient pressure
and temperature to the human operator. Some of these factors can be
measured and used for diagnostic purposes, others have to be estimated
or eliminated. Network-based diagnostics can surely help to get much
better control of machine performance."
AvantCom backs one of two approaches to real-time
network diagnostics. Saso says some tool suppliers already support so-called
point-to-point network diagnostics, where each vendor's office is connected
to individual process tools at the fab. AvantCom supports the central
clearinghouse model, which provides a single point of entry to the chip
plant and a secure central hub for access or routing of data to authorized
parties.
"It's early days yet, and if I were to speculate
I'd say it might be both methods that will be used," says Wohlwend.
He believes that smaller equipment firms probably don't have the resources
to implement point-to-point diagnostics and may opt for the clearinghouse
approach. Bigger tool vendors, having sufficient bandwidth capabilities
and dedicated lines, may have the resources to support the point-to-point
solution.
"Already there are at least 10 suppliers in this [market]
space," notes the program manager. "Some will be third-party software
companies doing clearinghouse work or automatic data collection. This
gets you into the world of APC and sensors. It's certainly fertile soil."
Indeed. Touting it as "a major step for 300-mm
IC manufacturers," a company in Austin, TX, announced in early December
its first enabling system for support of e-Diagnostics "at the tool
level." DomainLogix's OBEM XP supports the traditional 20-year-old SECS/GEM
interface. New standards such as OBEM, the SEMI E98 object-based equipment
model, were written "to provide a way to describe the composition and
behavior of complex equipment in a generic way and to support...advanced
technologies such as APC and predictive maintenance," says Margaret
Pratt, the standard's author.
The supplier says OBEM XP gives suppliers a standardized
method of receiving data and reducing the time needed to detect critical
failures, something that the existing SECS/GEM capabilities cannot do.